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Abstract
Thin Sn-O films were prepared by thermal evaporation of high-purity tin in a low-pressure oxygen atmosphere. The films were monitored by conversion electron Mossbauer spectroscopy (CEMS). Radioactive 111In+-ions were implanted into the films and perturbed angular correlation (PAC) measurements were carried out in air after different annealings up to 1023 K. Two phases were sufficient to describe the PAC data, which are attributed to SnO and SnO2. The temperature dependence of these phases was found to agree with CEMS measurements on Sn-O films after similar annealing programmes.
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