Abstract

We have developed hydrogenated amorphous silicon (a-Si:H) pin diodes with a rectification ratio of up to 10 orders of magnitude by optimizing their junction performance as rectifiers. It has been found that impurity control and careful elimination of parasitic effects are essential for improved device characteristics. The interaction between a-Si:H and Al causes deterioration of junction performance at relatively low temperatures.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.