Hydrogen desorption from copper during ion bombardment measured by SIMS

Abstract

Secondary ion mass spectrometry (SIMS) is a sensitive analysis method for hydrogen. In this paper, SIMS is used to observe the hydrogen desorption from copper caused by an ion bombardment, and the measurements reveal the following: hydrogen ion intensity is reduced by the industrial manufacturing procedure of copper, i.e. intermediate annealing and cold working. The less porosities the copper includes, the less hydrogen desorption it shows even though the hydrogen concentration of copper bulk is the same. The former suggests that hydrogen desorption from copper is promoted by thermal diffusion and grain boundary diffusion, and the latter suggests that the hydrogen desorption phenomena is closely related to the microstructural defects like grain boundaries or porosities that enhance the diffusion of hydrogen.