Hydrogen annealing induced physical properties of ZnTe thin films

Abstract

The ZnTe material has an unprecedented role in the fabrication of high efficiency CdTe thin film solar cells and optimization of hydrogen annealing induced physical properties of ZnTe films is next required step. Consequently, in the present work, the impact of Hydrogen annealing temperature on the structural, optical, electrical, topographical, morphological, and compositional properties of ZnTe films is explored. The ZnTe thin films (having 300 nm thickness) are grown via electron-beam evaporation technique on glass and ITO substrates followed by annealing at different temperatures under a Hydrogen atmosphere. The ZnTe films are found to crystallize in cubic phase with (111) predominant peak having crystallite size in the range of 19–28 nm, whereas annealed films demonstrated lower optical transmittance vis-à-vis to pristine films. The PL spectra exhibit two luminescence peaks with a stronger band at ∼351 nm and a weaker band at ∼450 nm. Ohmic behavior of ZnTe films is assured through I–V characteristics, while the AFM images revealed hill-like surface topographies. The FESEM image of pristine films demonstrated a homogeneous surface comprising spherical grains whereas annealed films have spherical, stone, and blisters like morphologies. The EDS patterns assured the Te element richness as well as successful ZnTe films deposition. The observed findings signify that the Hydrogen annealing at different temperatures notably modified the physical properties of ZnTe films. • Hydrogen annealing induced physical properties of ZnTe films are investigated. • The crystallite size is augmented from 19 to 28 nm for hydrogenated ZnTe films. • The straight lines to I–V characteristics ensure formation of Ohmic contacts. • Direct optical energy band gap is found within range of 2.00–2.51 eV for ZnTe films. • Surface topography revealed hill-like structures with varied surface roughness.