Abstract

Hybrid surface wave propagation through the interface of semiconductor and metal waveguides consisting of CuO/Al and ZnO/Al have been investigated by numerical simulation due to their potential applications. COMSOL Multiphysics is used to simulate the waveguides by adjusting model properties. For the comparative study, the propagation constant (γ), normalized phase (β), attenuation constant (α), propagation length (L), total electric and magnetic energy propagated through the CuO-based Al waveguides and ZnO based Al waveguide is discussed. Comparative studies for both modifications were performed from 0 THz to 12 THz. This study employed boundary conditions to have the continuous behavior of the electric field component of hybrid surface waves (exhibits characteristics of both transverse waves and longitudinal waves) at the interface between metal and semiconductor. The ZnO-based modification shows a higher propagation constant (γ) at all frequencies. Similar trends are observed for propagation length (L) and propagation constant (γ). Meanwhile, the attenuation constant (α) of the CuO-based Al waveguide is higher than that of the ZnO-based Al waveguide. An identical trend was perceived for both electrical and magnetic energy. Maximum parameters favour the ZnO-based Al waveguide, which makes it superior to the CuO-based Al waveguide for high-frequency applications.

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