Abstract

We describe the combination of scanning electrochemical cell microscopy (SECCM) and interference reflection microscopy (IRM) to produce a compelling technique for the study of interfacial processes and to track the SECCM meniscus status in real-time. SECCM allows reactions to be confined to well defined nm-to-μm-sized regions of a surface, and for experiments to be repeated quickly and easily at multiple locations. IRM is a highly surface-sensitive technique which reveals processes happening (very) close to a substrate with temporal and spatial resolution commensurate with typical electrochemical techniques. By using thin transparent conductive layers on glass as substrates, IRM can be coupled to SECCM, to allow real-time in situ optical monitoring of the SECCM meniscus and of processes that occur within it at the electrode/electrolyte interface. We first use the technique to assess the stability of the SECCM meniscus during voltammetry at an indium tin oxide (ITO) electrode at close to neutral pH, demonstrating that the meniscus contact area is rather stable over a large potential window and reproducible, varying by only ca. 5% over different SECCM approaches. At high cathodic potentials, subtle electrowetting is easily detected and quantified. We also look inside the meniscus to reveal surface changes at extreme cathodic potentials, assigned to the possible formation of indium nanoparticles. Finally, we examine the effect of meniscus size and driving potential on CaCO3 precipitation at the ITO electrode as a result of electrochemically-generated pH swings. We are able to track the number, spatial distribution and morphology of material with high spatiotemporal resolution and rationalise some of the observed deposition patterns with finite element method modelling of reactive-transport. Growth of solid phases on surfaces from solution is an important pathway to functional materials and SECCM-IRM provides a means for in situ or in operando visualisation and tracking of these processes with improved fidelity. We anticipate that this technique will be particularly powerful for the study of phase formation processes, especially as the high throughput nature of SECCM-IRM (where each spot is a separate experiment) will allow for the creation of large datasets, exploring a wide experimental parameter landscape.

Highlights

  • Supported by finite element method (FEM) simulations, we further demonstrate that the pattern of crystals formed within the scanning electrochemical cell microscopy (SECCM) meniscus is related to spatiotemporal variations in supersaturation within the provide local electrochemical control and monitoring of phase formation events

  • All potentials reported are for the working electrode (WE) electrode, which is the negative value of the SECCM quasireference counter electrode (QRCE) potential

  • We have demonstrated the combination of SECCM and interference reflection microscopy (IRM) to produce a new instrumental method for the investigation of electrochemically-driven phase formation phenomena with high spatial and temporal resolution

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Summary

Introduction

The ability to visualise and study phase formation and change is extremely important in materials science, to understand processes such as crystallisation, precipitation, and protection agents, new energy storage materials, among others. For phase formation and phase change processes, the ability to confine electrochemical reactions to small volumes allows the investigation of a few or even single events.54,55 In this context, the use of SECCM in hopping mode, where the SECCM meniscus is landed at a series of spots on a surface, is powerful, as it is possible to build up large datasets with the same, or different, experimental conditions applied to each spot. We combine SECCM with the surface sensitivity of IRM to investigate phase formation in tiny droplet cells at an ITO electrode surface We employ this new hybrid technique to visualise and monitor the evolution of the SECCM meniscus dimension during electrochemical actuation. Simulation details are further described in the FEM results section below

Results and discussion
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