Abstract
The key experimental parameters associated with the quick-scanning EXAFS (QEXAFS) technique have been examined systematically to arrive at a critical evaluation of the “speed limit” of this technique. With current technology, a 1000 eV EXAFS scan can be measured in 5-20 seconds, and a 100 eV XANES spectrum in 1-2 seconds, depending on the crystal monochromator used and actual energy range to be scanned. Further development is needed to achieve sub-second time resolution with this technique.
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