Abstract
Highly reliable industrial products impose insisted demands on manufacturers to carry out, before starting mass production, reliability demonstration tests for their new products in order to verify how they meet the reliability targets. However, due to cost and time constraints, a small number of the new products is available for testing and the reliability demonstration is not that easy, as conventional statistics cannot be directly applied. In this paper, four probabilistic approaches are discussed and compared in case of reliability demonstration with few test data. These approaches are the confidence interval, the test of hypothesis, the Bayesian approach and the compound uncertainties. The latter is proposed in this work as a robust tool for demonstration tests with small sample size.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
