Abstract
The stoichiometry and hydrogen content of hot-wire (HW)-grown silicon nitride was examined as a function of SiH 4/NH 3 flow ratio. The effect of post-deposition hydrogenation treatment on overall film hydrogen content was determined. The hydrogen release properties in Si-rich and N-rich nitride layers were characterized by annealing treatments. Defect hydrogenation was studied using Fourier transform infrared spectroscopy on platinum-diffused silicon substrates. HW nitride layers were deposited onto diffused emitter String Ribbon silicon substrates, producing cells with comparable short circuit current density, open circuit voltage, fill-factor, and efficiency to those fabricated using plasma chemical vapor deposition nitride layers.
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