Abstract
A novel method is proposed to detect the horizontal shift of a specific nanoblock relative to a reference nanoblock using surface plasmon modes at nanometer resolution. To accomplish this task, two orthogonal localized surface plasmon resonances were excited within the air gap region between the silver nanoblocks at the respective wavelengths, 890 nm, and 1100 nm. This technique utilized the scattering far-field intensities of the two block nanostructures at the two specific wavelengths at two specific directional spots. The ratio of the scattering intensities at the two spots changed according to the horizontal shift of the block that moved. Correspondingly, this ratio can be used to provide the precise location of the block. This method can be applied to many fields, including label-free bio-sensing, bio-analysis and alignment during nano-fabrication, owing to the high resolution and simplicity of the process.
Highlights
Remarkable improvements in nanotechnology have led to new prospects in many fields such as electronics, nanophotonics, and the biological sciences
We theoretically propose a simple and sensitive method to detect any relative movement along the horizontal direction between the two metal nanoblocks at a nanometer resolution
The proposed two-metal block structure enabled the determination of the horizontal displacement
Summary
Remarkable improvements in nanotechnology have led to new prospects in many fields such as electronics, nanophotonics, and the biological sciences. Mode 1 (or mode 2) yielded similar far-field patterns for the X or Y directional shifts in the XZ (or YZ) planes These distinguishable dependencies of the scattering far-fields of mode 1 (890 nm) and mode 2 (1100 nm) on the horizontal displacement, enabled the measurement of the horizontal position of the upper block with respect to the lower block by observing the scattering far-fields at 890 nm and 1100 nm.
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