Abstract
A completely scalable lumped-circuit model for horizontal HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: (a) geometrical, (b) temperature, and (c) field-dependent mobility effects, as well as for (d) the dynamic response and (e) the noise behavior of several HALL sensors. A series of experimental data is presented along with a review to junction field effect transistor (JFET) operation theory.
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