Abstract
Thin films of a layered thallium cuprate have been studied by XAS at Cu L 3-edge in normal incidence in order to estimate the doping hole densities n h in the [CuO 2] ∞ planes of the Tl(2212) structure. When going from as-synthesized samples to post-annealed ones under Ar, a decrease of the doping hole densities has been observed which corresponds to an increase of T c' s . In order to evaluate the surface effects on the results, the absorption has been recorded simultaneously in total electron yield (TY) and fluorescence yield (FY) modes. After full correction of the self-absorption of the soft X-ray fluorescence photon, the estimated doping hole densities appeared to be in good agreement whatever the detection method.
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