Abstract
In testing Mixed Signal Devices such as Analog to Digital and Digital to Analog Converters, some dynamic parameters, such as Differential Non-Linearity and Integral Non-linearity, are very critical to evaluating devises performance. However, such analysis has been notorious for complexity and massive compiling process. Therefore, this research will focus on testing dynamic parameters such as Differential Non-Linearity by simulating numerous numbers of bits Analog to Digital Converters and test the output signals base on new testing algorithms of Wavelet transform based on Hilbert process. Such a new testing algorithm should enhance the testing process by using less compiling data samples and prompt testing results. In addition, new testing results will be compared with the conventional testing process of Histogram algorithms for accuracy and enactment.
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