Abstract

This submission presents results on the frequency response of silicon resonant detectors, suitable for operation at wavelengths around 1550nm. The resonant structures are made sensitive to sub-bandgap light via the introduction of lattice defect states. An instability in operation is associated with the generation of free carriers within the resonant structure, producing a transient shift in the resonance wavelength. This manifests as a bit-pattern dependence for the detector, limiting the bandwidth of operation.

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