Abstract

By application of the electrooptic Pockels effect of the BSO (Bi/sub 12/SiO/sub 20/) crystal, a measurement method for measuring the electrical surface charge distribution on an insulating film was developed. Using an image lock-in amplifier and a spatial optical phase modulator, the measurement system was improved with respect to sensitivity and resolution. With this improvement, the amount, polarity, and pattern of surface charges produced by an impulse surface discharge on insulating materials can be observed very clearly. The spatial resolution is enhanced from 750 /spl mu/m to 200 /spl mu/m, and the sensitivity is also enhanced. The typical surface charge distribution of a positive streamer generated by a high-voltage impulse (5 kV peak) is presented. >

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