High-resolution X-ray scattering from CdMnTe/CdTe multiple quantum well structures

Abstract

Cd1−xMnxTe/CdTe multiple quantum well structures have been investigated by high-resolution X-ray diffraction methods. Reciprocal space maps of the scattering distribution around the 004 reciprocal point and individual transverse scans showed that the crystalline quality of the epitaxial layers was high. The peak widths, at both the half maximum and one tenth maximum, of transverse scans along theqx direction at differentqz positions, showed no systematic variation with satellite order. Analysis of the X-ray diffraction profiles around the 004 reciprocal lattice point indicated the presence of an interfacial phase, of thickness between 0.2 and 0.6 nm for different samples, between the InSb substrate and CdTe buffer layer. This interfacial phase mainly influences the secondary interference fringes and high-angle tails in the diffraction profiles.