High-resolution total-cross-section measurements for electron scattering from Ar, Kr, and Xe employing a threshold-photoelectron source

Abstract

Absolute total cross sections for electron scattering from Ar and Xe at electron energies ranging from 7 meV to 20 eV were obtained with the experimental technique employing the threshold-photoelectron source. The measured total cross sections are in good agreement with those obtained by other groups down to 100 meV, above which several experimental works have been reported. Scattering lengths for electron scattering from Ar, Kr, and Xe were determined from the present total cross sections and our recent results for Kr using the modified effective range theory. The values of the scattering length obtained in the present analysis differ from the values determined from the previous swarm experiments and beam experiments. The resonant structures in the total cross sections due to Feshbach resonances of Ar, Kr, and Xe with an improved energy resolution were also measured. Analyses of the resonant structure were carried out based on the spin-dependent resonant scattering theory in order to determine the values of the natural width of Feshbach resonances of Ar, Kr, and Xe precisely.