High-Resolution Mobility Spectrum Analysis of Multicarrier Transport in Advanced Infrared Materials

Abstract

In this paper the recently developed high-resolution mobility spectrum analysis is demonstrated. In a number of simulations the high resolution of the algorithm is demonstrated in the high and low mobility ranges. The effect of random noise, maximum magnetic field limit, and the number of magnetic field points used in the experiment is also demonstrated. Also discussed are requirements critical for obtaining high-quality experimental data. The application of this new algorithm to complex semiconductor structures to study lateral and vertical transport is also demonstrated, resulting in insight into previously unavailable details.