Abstract
Experimental electron microscopy results of lattice imaging in electron beam-sensitive materials are described. The electron doses to record lattice images and to destroy crystalline diffraction have been measured and compared in copper phthalocyanine and cytosine monohydrate. The results indicate that it is possible to record electron micrographs at a resolution close to the theoretical limit even in materials which exhibit a relatively high resistance to radiation damage and therefore have structures which are resolvable on a molecular scale.
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