Abstract
A novel scheme for high-reliability optical process level network (OPLN) with all-optical passive edge nodes in smart substation is first proposed, supporting both sampled value and generic object oriented substation event services with multicast traffic pattern. The edge node consists of n passive optical distribution modules and one arrayed waveguide grating, realizing the all-optical interconnection inside bays to reduce the optical-electrical and electrical-optical processes. A software defined network based center switch schedules all intelligent electrical devices in the network using multi-point control protocol. The analytical model for the OPLN reliability is established based on fault tree analysis. The results show that the OPLN can achieve almost two-fold mean-time-between-failure as compared to the Ethernet switch based network. Moreover, 99.99% availability can be obtained when network scale is up to 24 bays under dual-network redundancy.
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