Abstract
Single-crystalline La 3Ga 5SiO 14 (LGS) films could be grown by liquid phase epitaxy (LPE) for the first time. These films were obtained on X- and Y-oriented LGS substrates (homoepitaxy) from a PbO-based flux, and were characterized by Nomarski microscopy, AFM, SEM/EDX and XRD. Best results were obtained for Y-oriented films, with macrosteps propagating over macrosopic dimensions (>1×1 cm 2). Very flat areas with height variations within 1.4 nm over 8 μm lateral distance were measured by AFM. These films have a thickness of a few micrometer, are crack-free due to perfect lattice match, and no solvent inclusions or secondary phases were found.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
