Abstract

The effect of high pressure on electrical properties has been investigated for two sets of Si 9As 14Te 21 ternary chalcogenide amorphous semiconductor samples, fabricated either in a microgravity environment (rocket or spacelab) or under the gravity environment of earth. The primary effect of pressure is a decrease in interatomic distances; the compression gives rise to changes in electronic structure and a transition from semiconductor to metal. For pressures up to 3 GPa, the decrease of the resistivity of space-made materials is not significant compared with the terrestrially-made materials, whereas for higher pressures the change in resistivity of both kinds of material is similar in shape and extends for the same orders of magnitude.

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