Abstract
Metal halide perovskites have gained significant attention as promising materials for ionizing radiation detection due to their facile fabrication process, exceptional optoelectronic properties and high attenuation coefficients. To effectively absorb the incident X-ray photons, thick active layers have been reported and fabricated via spray-coating. However, the conventional spray-coating method is susceptible to various adverse effects, making it challenging to achieve high-quality thick perovskite films. In this work, we propose the use of antisolvent-assisted spray-coating to deposit perovskite films, which results in small surface roughness, thick films on various substrates. The slow growth of the thick film and the ability to regulate its crystallization through the modulation of processing atmosphere were also carefully studied. The optimized X-ray detector demonstrated a sensitivity of up to 3370.8 μC Gyair−1 cm−2, demonstrating its great potential for X-ray detection applications.
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