Abstract

The Al-doped ZnO (AZO)/indium tin oxide (ITO) bilayer films were proposed as transparent contact layers (TCLs) for the fabrication of GaN-based light-emitting diodes (LEDs). In TCLs on the p-type GaN layer, the ITO film serves as the ohmic contact layer with the thickness of only 20 nm, whereas the 300–750nm AZO films act as the current spreading layer. At an optimal AZO thickness of 500 nm, GaN-based LEDs with AZO/ITO TCLs have a forward voltage of 3.36 V, an electroluminescence emission at 526 nm with highest brightness and a large light intensity of 386 mcd at 20 mA, which are almost the same as the commercial LEDs with a 300-nm ITO TCL. The 500-nm AZO/20-nm ITO bilayer films exhibit a high transparency above 90% in the visible region, but they display a low conductivity with resistivity $\sim 7 \times 10^{-3}~\Omega \cdot $ cm. The success of GaN-based LEDs with such a relatively high-resistivity electrode strongly demonstrates that the AZO/ITO film is a very effective and practical TCL on the p-type GaN layer. The indium-saving AZO/ITO TCLs may be actually a universal approach as p-type electrodes in high-performance GaN-based LEDs for commercially mass production with low cost.

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