Abstract

This paper presents a highly sensitive phase-variation sensor for dielectric constant measurements based on a capacitively-loaded periodic slow-wave transmission line. Such line is implemented in microstrip technology, and the loading capacitors are formed by closely spaced rectangular patches. The sensing area of the device is delimited by the region occupied by the capacitive patches, where the material under test (MUT) must be located. The presence of the MUT modifies the coupling capacitance between adjacent patches, thereby producing a variation in the electrical length, or phase of the transmission line, which is the output variable. A detailed analysis of the equivalent circuit model of the unit cell, useful for design purposes, is carried out in the paper. Based on such analysis, a prototype device sensor is designed and fabricated. It is demonstrated in the paper that the sensitivity of the proposed sensor is by far superior to the one achieved in an ordinary meandered line with similar sensing area. Thus, the proposed slow-wave structure constitutes a good alternative to meandered lines for the implementation of phase-variation sensors with simultaneously high sensitivity and compact size.

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