Abstract
In this article, we propose a method, using weakly coupled cantilevers, to enhance the sensitivity of atomic force microscopy (AFM) by several orders of magnitudes. There are two major dynamics AFM methods, i.e., amplitude modulation AFM and frequency modulation AFM (FM-AFM). In FM-AFM, which is based on the eigenfrequency shift of a single cantilever, the enhancement in sensitivity is restricted because of the limitations of miniaturization in the manufacturing process. By contrast, we used coupled cantilevers based on the eigenmode shift, which corresponds to the amplitude ratio between the cantilevers. This enabled us to increase the sensitivity by reducing the coupling stiffness between cantilevers without relying on further miniaturization. In addition, to detect the eigenmode shift, even in high-viscosity environments, we produced self-excitation in the weakly coupled cantilevers by feedback control. Using this prototype system of coupled macroscale cantilevers subjected to the magnetic force, which simulates the atomic force, we confirmed the high sensitivity of the proposed method.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.