Abstract

The outstanding progress made in optoelectronic technologies calls for a renewed performance assessment of photodetectors (PDs) for next-generation sensing applications. Here, TiO2/Ag/TiO2 tri-layered films were sputtered using the GLancing Angle Deposition (GLAD) technique in which the deposition angle was varied from 0 to 80°. Before the elaboration, a strategic combination of Genetic Algorithm (GA) and numerical analysis was used to find out the best multilayer geometry offering superior optical performance. The influence of the inclined architecture on the performance of the prepared TiO2/Ag/TiO2 multilayer was analyzed. Optical characterization reveals that near-perfect UV photodetection and over than 60% of visible-absorbance were achieved by taking a deposition angle of 80°. These enhancements are correlated to the surface nano-sculptured structures, which gives rise to an enhanced light-trapping capability. The measured I-V curves of the obliquely-deposited structures showed a clear photovoltaic mode and an extremely low dark current of a few picoamperes. Besides, the devices demonstrate an enhanced self-powered UV–Vis photoresponse, yielding superb UV and visible responsivity of 0.2A/W and 47 mA/W, respectively. The UV, blue, and green current ratios were respectively 137, 113, and 107 dB. Therefore, promoting efficient light management, this innovative concept of inclined tri-layer films provides a sound pathway for designing potential alternative self-powered UV–Vis PDs appropriate for the future development of the optoelectronic technology.

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