Abstract
We present a newly designed compact and flexible soft X-ray spectrometer for resonant inelastic X-ray scattering (RIXS) studies within an energy range from 380 eV to 410 eV, which would include the K alpha emission lines of vital elements like nitrogen. We utilized an off-axis reflection zone plate (RZP) as the wavelength selective element with a maximum line density of 10000 l/mm. A higher energy resolution over a broader range of ± 15 eV around the designed energy was achieved by displacing the RZP. Additionally, for the first time, an actual optical side effect, the so-called comatic aberration was exploited to increase the energy resolution. First results show a resolving power in the order of 1300 for photon energy of 395 eV, which is comparable to a commercial varied line spacing grating (VLS).
Highlights
Resonant inelastic X-ray scattering (RIXS) has become a popular tool to study the elementspecific electronic structure of complex systems in hard and soft condensed matter or in chemical reactions
We present for the first time soft X-ray emission spectroscopy measurements utilizing a reflection zone plate (RZP)
To compensate the weakness of RZPs we propose to elongate the source RZP distance to achieve a more homogenous energy resolution over a larger energy range
Summary
Resonant inelastic X-ray scattering (RIXS) has become a popular tool to study the elementspecific electronic structure of complex systems in hard and soft condensed matter or in chemical reactions This photon-based method is bulk, element, orbital and site specific as well as polarization sensitive [1,2]. The detection efficiency of soft X-ray spectrometers is low due to grazing incidence gratings and long distances between source and optical element, which lead to a very small solid angle [13,14,15]. This results in a need for brilliant light sources. The optimization becomes time consuming and theses devices are usually permanent end stations, which are not suited for a flexible spectrometer
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