Abstract
Perfluorooctanesulfonate (PFOS) is a persistent organic pollutant that is bioaccumulative and toxic. While its use in most countries has been restricted to certain industrial applications due to environmental and health concerns, chrome plating and semiconductor manufacturing facilities are industrial point sources of PFOS-containing wastewater. Current remediation technologies are ineffective at treating these highly concentrated industrial effluents. In this work, UiO-66 metal–organic frameworks (MOFs) of several defect concentrations were studied as sorbents for the removal of PFOS from concentrated aqueous solutions. PFOS sorption isotherms indicated that defective UiO-66, prepared with HCl as a modulator, had a maximum Langmuir sorption capacity of 1.24 mmol/g, which was ∼2× greater than powdered activated carbon (PAC), but ∼2× less than that of a commercial ion-exchange resin. Defective UiO-66 adsorbed PFOS 2 orders of magnitude faster than the ion-exchange resin. Large pore defects (∼16 and ∼20 A) ...
Published Version
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