Abstract
Instrumentation and software are described, which are used to determine maps of properties of materials based on optical transmission spectra. In addition to a Fourier transform spectrometer, the hardware includes an xy stage containing a small stationary aperture and two computer controlled stepper motors for positioning the sample. This idea has been used for years, but our implementation is highly automated compared to those previously described. All mapping has been in the 2–15 μm wavelength range but this is not an inherent limitation of the technique. In this spectral range, useful results may be obtained with apertures as small as 25 μm in diameter. The software is described including the algorithm for obtaining the cut-on wavelength from a semiconductor spectrum. Data from both transverse slices and longitudinal slabs of narrow bandgap alloy semiconductors are shown including composition maps for materials solidified with convex and concave growth interfaces.
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