Abstract

For the development of the YBa/sub 2/Cu/sub 3/O/sub y/ (YBCO) coated conductors, processing of the thicker film and long tape have been investigated using the metal organic deposition (MOD) method with the trifluoroacetates solution. About 1 micro-meter thick MOD film was realized by the control of the P/sub H2O/ condition during annealing for the formation of the YBCO layer. The improvement was explained by the competition between the nucleation of the undesirable grains and the epitaxial growth up to the surface. By applying the suitable condition to the metallic substrate system, high critical current density (Jc) and critical current corresponding to 1 cm wide tape (Ic/sup */) were realized as to be 1.6 MA/cm/sup 2/ and 153 A/cm-w in the film with 1 micrometer thickness, respectively. For the fundamental investigation of long tape processing, influence of the gas flow direction during annealing for the YBCO formation was investigated. Although nonuniformities in the X-ray diffraction (XRD) intensities and Jc values were recognized in the film grown under the gas flow parallel to the long direction of the tape, both of them was improved by changing the gas flow direction to the transverse one.

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