Abstract
The characterization of the dielectric properties of a material requires a measurement technique and its associated analysis method. In this work, the configuration involving two coaxial probes with a material for dielectric measurement between them is analyzed with a mode-matching approach. To that effect, two models with different complexity and particularities are proposed. It will be shown how convergence is sped up for accurate results by using a proper choice of higher-order modes along with a combination of perfect electric wall and perfect magnetic wall boundary conditions. It will also be shown how the frequency response is affected by the flange mounting size, which can be, rigorously and efficiently, taken into account with the same type of approach. This numerical study is validated through a wide range of simulations with reference values from another method, showing how the proposed approaches can be used for the broadband characterization of this well-known, but with a recent renewed interest from the research community, dielectric measurement setup.
Highlights
The behavior of a material under the exposure to electromagnetic fields is determined by its dielectric properties
The first model uses two coaxial waveguides attached to both sides of a virtual circular waveguide filled by the sample material, which is Router IO coaxial (b) Rinner IO coaxial (a) εr,coax εr,sample (MUT) μr,sample (MUT) Sample Thickness (d)
The reference values are provided by the method from the Dielectric Assessment Kit (DAK) product line manufactured by the Swiss company SPEAG [32], used in high-precision systems for measurements of dielectric properties
Summary
The behavior of a material under the exposure to electromagnetic fields is determined by its dielectric properties. In comparison with other full-wave methods [14], it shows a great efficiency, which will be further improved by exploiting the specific features of the geometry associated with the two-port coaxial probe measurement problem. Two different models based on mode-matching along the longitudinal direction are proposed for characterizing the two-port problem associated with the coaxial probe for dielectric measurement of homogeneous samples. The second model will take the flanges of the setup into account The convergence of these models with respect to different parameters will be studied, resulting in a very efficient tool that can be used for the broadband analysis of the two-port scattering problem of a material sample placed between two coaxial probes for dielectric measurement
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