Abstract
In tapping-mode atomic-force microscopy usually amplitude and phase of the cantilever motion are acquired. These signals are related to the fundamental oscillation frequency neglecting information at higher frequencies. However, the nonlinear contact between tip and sample induces higher frequency vibrations that are harmonics of the fundamental. In order to recover the available information the full tip motion has to be analyzed. The higher harmonics can be employed for image formation. A setup that consists of two independently operated lock-in amplifiers is used to detect higher harmonics in the dynamic atomic-force microscopy signal. Higher harmonic imaging proves to be useful to monitor the imaging conditions in tapping mode and can be applied for nanoscale imaging with a material contrast.
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