Abstract
Two simulation approaches for prediction of energy loss in high-voltage power transistors (∼600V) operating under ZVS (Zero-Voltage-Switching) and near-ZVS conditions are presented and proved by experiment in this work. The first approach is based on finite-element simulation whereas the second one proposes a new SPICE model. Different from prior works, both models feature COSS hysteresis and related energy loss, thus showing high precision in replicating waveforms and energy loss for real tests in the primary-side of LLC resonant converters.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
