Abstract
We achieved high visibility first-order subwavelength interference based on light pulse storage and retrieval technique via electromagnetically induced transparency (EIT) effect in a Pr3+:Y2SiO5 crystal. The interference field distribution of a double-slit was first stored in a Pr3+:Y2SiO5 crystal based on EIT effect, and then it was read out by a spatially modulated readout beam. The retrieved output field is proportional to the product of the input interference field of the double-slit and the spatially modulated readout field. High visibility first-order subwavelength interference with an effective wavelength of λ/n, where λ is the wavelength of the input light field and n is any positive integer, can be obtained by designing the spatial modulation structure of the readout field. Experimentally, first-order subwavelength interference with an effective wavelength of λ/3 and a visibility of 67% were demonstrated. Such first-order subwavelength interference has important applications on high resolution optical lithography.
Highlights
Optical interferometric effect is of great importance in both fundamental physics and practical applications such as optical lithography and precision measurement[1]
Induced transparency effect is a result of destructive quantum interference among multiple atomic transition paths, which provides a powerful way for coherent manipulation on the interacting light fields and the optical properties of the atomic media[22,23,24,25,26,27]
Subwavelength interference in high-order optical coherence with an effective wavelength of λ/n was reported for both quantum light sources and classical light sources
Summary
Optical interferometric effect is of great importance in both fundamental physics and practical applications such as optical lithography and precision measurement[1]. Through similar light pulse storage and retrieval procedure to double the spatial frequency of the interference pattern as described above, but replacing the π-phase-shifted double-slit mask with the π-phase-shifted n-slit mask in the optical path of readout beam ER, one can obtain a retrieved output signal field as ES′(x) ∝
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