Abstract
Two GexNbTaTiZr (x=0.5, 1) compositions were designed to show excellent thermal stability in amorphous structure. Both amorphous structures in the deposited thin film can be retained after one-hour vacuum annealing at 700°C and 750°C, respectively. Thermodynamic, topological and kinetic factors governing this excellent thermal stability are discussed via high entropy effect, atomic size differences and sluggish diffusion phenomena.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
