Abstract
Structural investigations at high temperature were carried out on compound Li2VOSiO4, which crystallises with a natisite-type structure. Unit-cell parameters were measured and diffracted intensities collected at regular intervals in the temperature range 25–500 °C using single crystal X-ray diffraction techniques. Thermal expansion coefficients showed positive expansion of lattice constants, greater along the c direction, and of cell volume. Reversibility of thermal expansion in the investigated temperature range was checked by measuring unit-cell parameters after the crystal was cooled down from 500 °C to room temperature. Structure refinements revealed that the [VOSi4]n 2− layers are almost rigid and that the most relevant modifications occur at the intercalated ion layer.
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