Abstract
Temperature stability is one of the key factors for energy storage application of dielectric capacitors especially under stringent environmental conditions. In this work, we report that the (Pb0.9La0.1)(Zr0.65Ti0.35)O3 ceramic exhibits small variation of energy density (<15%) over a wide temperature range (24°C~83°C) at low field strength (E<25kV/cm). Further TEM observation and phase field simulations suggest that it can be attributed to continuous formation and growth of polar nanoregions with temperature and electric field, resulting in high-temperature stability for dielectric permittivity and energy density. Our finding may have implications for developing dielectric energy-storing devices with high thermal reliability.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
