Abstract
AbstractThe point defect equilibrium of CdTe〈Pb〉 single crystals under well‐defined Te vapor pressure was investigated up to 1070 K. At 630–900 K these crystals showed p‐type conductivity and at higher temperatures – native n‐type one. During measurements the hole density reached up to ∼2 × 1017 cm–3 at 800 K. The main acceptor dominant species, which determined the electrical properties of crystals, was supposed to be the (Pb$ ^+_{\rm Cd} $V$ ^{2-}_{\rm Cd} $)– associate with its level in the gap located at EV + 0.42–0.45 eV. Above 900 K native electrons began to influence the conductivity type. Three models of point defect structure were used to describe the galvanomagnetic data – (i) frozen defect structure, (ii) defect structure with shallow or deep acceptor levels fixed during thermal cycles and native defects being in three‐phase solid–liquid–gas (SLG) equilibrium, and (iii) defect structure without any fixed energy level and defect densities being determined by the SLG equilibrium. The FWM technique confirmed p‐type photoconductivity at 300 K, but also revealed bipolar carrier generation at high photoexcitation levels with very fast electron trapping. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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