Abstract
With the continuous development of integrated electronics and the increasing demand for downhole resource exploration, it has become important to develop a small size, high temperature resistant, high-performance digital fluxgate sensor. Due to the strict size limitation of downhole exploration equipment, some high-temperature devices are generally large in size and have a different performance of the same type of devices, so it is necessary to select the devices that meet the temperature requirements through high-temperature experiments. In this paper, by simplifying the circuit structure and selecting devices through high-temperature experiments, the usability of the circuit structure at 175°C and the stable performance in long-time operation at high temperature were verified.
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