Abstract
High temperature creep of polycrystalline NiO appears to be controlled by oxygen lattice diffusion at temperatures between 1273 and 1373 K and at stress levels from 34.5 to 79.8 MPa (5 to 11 ksi). Experimentally observed creep rates agree well with predictions obtained from deformation maps based on self-diffusion data. TEM examination indicates that dislocations present in crept NiO specimens are predominantly glide-type rather than climb-type dislocations as found in CoO. The difference in creep behavior of these materials is believed to be due to the difference in stacking fault energies and the nature of charge associated with lattice defects.
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