Abstract
AbstractIn the domain of high‐performance short‐wave infrared (SWIR) photodetection and imaging, existing technologies predominantly utilize single‐crystal germanium and III‐V semiconductors. Despite their efficacy, these materials are encumbered by laborious synthesis and complex fabrication demands. In this study, the synthesis of large‐area, high‐crystallinity Se0.2Te0.8 thin films through a CMOS‐compatible vacuum thermal evaporation process is reported. A high‐speed, broad‐spectrum photodetector engineered with an innovative Gr/Se0.2Te0.8/GaAs vertical heterostructure is presented, which capitalizes on the augmented carrier mobility and employs graphene innovatively as both a carrier collection interface and an electrode. This configuration facilitates a remarkably swift response time of 800 ns/1 µs at the crucial 1310 nm wavelength for optical communications. Moreover, the fabrication of a 5 × 5 array device demonstrates substantial SWIR imaging capabilities at ambient conditions, marking a paradigm shift in uncooled infrared imaging and communication technologies. This work not only extends the boundaries of SWIR photodetector performance but also underscores the potential of novel material systems in high‐speed optical applications.
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