High-speed operation of RSFQ circuits up to 30 GHz

Abstract

We have experimentally demonstrated high-speed operation of RSFQ circuits using on-chip testing system and confirmed normal operation up to 30 GHz. The system includes high-frequency pulse generators and shift registers (SRs) serving as an interface circuit between high-speed internal signals and low-speed external signals. We adopted two ladder-type pulse generators. One generates clock pulses of 10 GHz and the other generates 25 GHz. By increasing bias currents of JTLs, clock pulses can be generated at higher frequency. By using the system, an SR and a T flip-flop (TFF) gate are examined. The circuits were fabricated by NEC's standard process based on Nb/AlOx/Nb junction technology with Jc = 2.5 kA cm-2. We optimized circuit parameters by using Monte Carlo simulation. In addition, the effect of parasitic inductances can be reduced by decreasing Ic. As a result, the systems for SR and TFF worked correctly up to 30 GHz and 27.5 GHz, respectively. The SR and TFF have wide bias margins of ±39% and ±20%, respectively. We confirmed that the bias margins of the SR are independent of operation frequency. The limits of operation frequency are thought to be much higher than 30 GHz.