Abstract
This paper addresses with the problems in automated visual inspection of automotive instrument cluster dials for which appearance quality criteria are based on human sensibility. By analyzing the experimental human visual sensibility for defects, two types of defect identification method are proposed for pinhole and for particle and scratch. To execute these identification methods in real-time, a pipelined image processor composed of FPGA boards has been newly developed and introduced into the dial manufacturing line as an automatic inspection system. The result of test operation was satisfactory.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
