Abstract
In this study, we developed a photonic band microscope based on hyperspectral Fourier image spectroscopy. The developed device constructs an infrared photonic band structure from Fourier images for various wavelength obtained by hyperspectral imaging, which make it possible to speedily measure the dispersion characteristics of photonic nanostructures. By applying the developed device to typical photonic crystals and topological photonic crystals, we succeeded in obtaining band structures in good agreement with the theoretical prediction calculated by the finite element method. This device facilitates the evaluation of physical properties in various photonic nanostructures, and is expected to further promote related fields.
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