Abstract
We present a position-sensitive neutron detection technique based on a Commercial Off-The-Shelf CMOS image sensor (CIS) covered with nanoparticles of sodium gadolinium fluoride (NaGdF4). The synthesis procedure and characterization of the NaGdF4 nanoparticles are detailed, as well as the deposition method of the conversion layers over the surface of the chips. We also present a manufacture method of test patterns made with neutron-absorbing materials. These patterns were designed to evaluate the performance of the proposed technique. Analyzing the obtained neutron images we conclude that the intrinsic spatial resolution of the developed method is better than (15±6) μm, this upper bound for the spatial resolution is comparable with that obtained with the best neutron position-sensitive detectors available nowadays.
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