Abstract
High resolution surface chemical imaging tools like the time-of-flight secondary ion mass spectrometer (TOF-SIMS) and Auger electron spectrometer (AES) are used to determine the surface chemistry and the distribution of trace amount of tribochemical materials on the magnetic recording heads and media surfaces that have undergone frictional contact. Small and spatially distributed deposits or films on the tribosurfaces of magnetic recording heads and disks have been analyzed and imaged to identify the material, the possible tribochemical processes, and the changes in protective coating. Features on these surfaces are mapped at submicron resolution and the chemical elements and molecules distribution are correlated to the physical topography of the surface or deposits. Small particles causing third-body damage, scratch line, are also imaged and identified. Such a high resolution chemical imaging capability is very useful for the study of head-disk interface tribochemistry and failure.
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