Abstract
Static Fourier transform spectrometers (S-FTSs) are well-consolidated instruments providing high throughput and high spectral resolution in a narrow spectral band. They use two reflective gratings as dispersive elements in a Michelson interferometer. Gratings allow high spectral dispersion and consequently high resolution, but, due to the light diffused from their grooves, they are one of the main noise sources in the reconstructed spectrum. In this work, we compare the signal-to-noise ratio performance of a prism-based S-FTS with that of a grating-based S-FTS. As a primary advantage, prisms give intrinsically lower diffused light than gratings. Furthermore, they do not have multiple diffracted orders, reducing thereafter the optical constraints on the instrumental baffling.
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