Abstract
A high-sensitivity silicon-on-insulator (SOI) metal-oxide-silicon (MOS) photodetector compatible with conventional silicon technology is proposed. Its operation principle is based on that of a lateral bipolar transistor in spite of an SOI MOS device structure. Photodetectors with narrow base width or short channel length have high current gain which is attributed to a self-biased effect under illumination. Current gain as high as 100 has been achieved for the device with a channel length of 1.0 µm. Measured intrinsic response time for optical pulses is 19 µs for the photodetector with a channel length of 0.7 µm.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
