Abstract
We propose a sensor based on spectral as well as angular interrogation of lossy mode resonance between absorbing thin film lossy modes and the evanescent wave for measurement of variation in the refractive index of the bulk media. It is shown that a low index dielectric matching layer introduced between the prism and the lossy waveguiding layer can produce an efficient refractive index sensor. The obtained sensitivity (4000–5000nm/RIU) is comparable to some of the best surface plasmon resonance (SPR) sensors. Unlike the SPR sensor in which surface plasmons can be excited only by p-polarized (TM) light, the proposed sensor can operate at either of these polarizations. Detailed theoretical analysis of the proposed sensor based on Fresnel reflection coefficients and transfer matrix method is presented. Effect of losses (imaginary part of refractive index) on the sensor parameters is also presented in sufficient details. Various parameters such as resonance angle, film thickness and refractive index of various layers are optimized for maximum evanescent field enhancement and increased sensitivity.
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